The 7600F is a field-emission scanning electron microscope that magnifies up to one million times for visualization and imaging of nanoscale-sized objects. It provides optimal tools for studying the widest possible variety of sample materials:
high stable probe current
upper and lower secondary-electron detectors
retractable in-lens backscatter detector
low-angle backscatter detector
scanning transmission electron (STEM) detector
energy-dispersive X-ray spectrometry
Funded by a National Science Foundation grant (DMR-0923354) for over half a million dollars, this versatile and powerful instrument advances investigational capabilities at 线上赌博app to match those at some of the country’s most prestigious research universities.
According to 线上赌博app Distinguished Professor Kalpana Katti, “This suite of SEMS and TEMs at 线上赌博app Electron Microscopy will significantly expand the research enterprise on 线上赌博app in the field of materials and bring it to national and international prominence as well as go a long way towards outreach efforts to K-12 students in ND in guiding and inspiring students towards high technology.”
